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| Electron crystallography (including some practical examples )
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Z. G. Pinsker, Electron Diffraction, Butterworths Scientific Publications, London 1953.
B. K. Vainshtein, Structure Analysis by Electron Diffraction, Pergamon Press, Oxford 1964
B. Zvyagin, Electron-diffraction analysis of clay mineral structures, Plenum Press, NY 1967.
J. M. Cowley (Ed.), Electron Diffraction Techniques, Volume 1 and 2, Oxford University Press
D. L. Dorset, Structural Electron Crystallography, Plenum Press, NY and London 1995.
M. De Graef, Introduction to Convetional Transmission Electron Microscopy, Cambrige Univ.
M. Tanaka, Convergent-beam electron diffraction, Acta Cryst. (1994). A50, 261-286
J.M. Cowley, Diffraction physics, North-Holland, Amsterdam, second revised edition, 1981
P. B. Hirsh, A. Howie, R. B. Nicholson, D. W. Pashley and M. J. Whelan, Electron Microscopy
of Thin Crystals (2nd revised edition), Krieger, Malabar, FL, 1977
J.C.H. Spence and J.M. Zuo, Electron Microdiffraction, Plenum Press, new York, 1988
P. Buseck, J. Cowley, L. Eyring, High-Resolution Transmission Electron Microscopy and
Associated Techniques, Oxford University Press, 1988
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Structure refinement –Maximum Entropy
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D. L. Dorset and C. J. Gilmore, Prospects for kinematical least-squares refinement in polymer
electron crystallography, Acta Cryst. (2000). A56, 62-67
C. J. Gilmore, Maximum Entropy and Bayesian Statistics in Crystallography: a Review of
Practical Applications, Acta Cryst. (1996). A52, 561-589
G. Voigt-Martin, D. H. Yan, A. Yakimansky, D. Schollmeyer, C. J. Gilmore and G. Bricogne,
Structure determination by electron crystallography using both maximum-entropy and
simulation approaches, Acta Cryst. (1995). A51, 849-868
A.P. Zhuklistov, B.B. Zvyagin, Crystallography Reports, vol. 43, nº 6,, 1998, p.950
A.P. Zhuklistov et al, Crystallography Reports, vol. 42, nº5, 1997, 841-845.
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Electron beam precession and applications |
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J.Gjonnes, V.Hansen , A. Krerneland Microscopy and Microanalysis 10 , 16-20, (2004)
T. E. Weirich, J. Portillo, G. Cox, H. Hibst, S. Nicolopoulos Ultramicroscopy 106 (2006) 164-175.
M. Gemmi , S.Nicolopoulos, Ultramicroscopy ( 2006 issue)
R Vincent, P.A Midgley, Ultramicroscopy 53 (1994) 271
JP Morniroli, A Redjaimia , S Nicolopoulos Ultramicroscopy (2006 issue )
J.Gjonnes,V.Hansen,A.Krerneland Microscopy and Microanalysis 10,16-20, (2004)
M. Gemmi, X. Zou, S. Hovmoller, A. Migliori, M. Vennstrom Y. Andersson, Acta Cryst A59 (2003) 117-126.
C.S.Own, A.K Subramanian ,L.D.Marks L. Marks ,Microscopy and Microanalysis 10 , 96-104, (2004)
M. Gemmi , S.Nicolopoulos Ultramicroscopy ( 2006 issue)
D.Dorset , C.Gilmore , JL Jorda, S.Nicolopoulos Ultramicroscopy ( 2006 issue)
CS Own, LD Marks , W. Sinklair Review of scientific instruments 76, 033703 (2005)
S Nicolopoulos, A Kuligin, K Kuligin, K Boulahya , G Lepeshov, JL DelPlancke , AS Avilov, M Nickolskiy A Ponce Electron Crystallography NATO Science Ser II vol 211 Springer 2006
A. Dudka, A Avilov , S Nicolopoulos Ultramicroscopy (2006 issue )
Yimei Zhu Measurements of Valence electron distribution using QCBED Elcryst2005 electron crystallography School Brussels September 2005
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