TEM  electron diffraction  intensities can be measured  by  films , image plates  and CCD cameras.  Intensity dynamic range for film is very low  ( 8 bit  or 256 grey levels ) although is bigger for  image plates (20 bit ) and CCD cameras ( from 12 bit  up  to 16 bit/64.000 grey levels ). ED patterns may have a huge dynamic range  (1 to 10 exp 6 ) and is not possible to measure accurately all ED  reflections with  previous detectors  at such dynamic range .

The  unique  (Patent protected ) single  nanocrystal  electron diffractometer  in combination with “spinning star” precession unit and  ( or stand-alone )  is able to scan  and measure  very  precisely  electron diffraction  reflections  with ultrahigh accuracy  at 24 bits dynamic range  (16.000.000 grey levels).

Electron diffraction intensities are  measured precisely by  scanning ED  pattern through specially designed   point detector ; every diffraction spot ( or pixel of ED spot ) can be measured  hundred of  times ( user defined ) for better statistical accuracy.

This ultrahigh  accuracy for measurement of diffraction  intensities is important to reveal  precise  stoichiometry, light  atom detection , occupational parameters  and  reveal bonding effects and   electrostatic  potential  distribution  in  samples. Typical diffraction patterns  (500 reflections) can be measured from few seconds to minutes in combination  with  precession  and integral intensities can be accurately  measured  after  background  correction.

Electron diffractometer « Pleiades » can be interfaced with any TEM at the 35 mm port  by  means of  specially designed mechanical  inteface (Fischione  Inc )and compatible with  HAADF detector or CCD  at the same port.